D3286 Pulse Pattern Generator/Bit Error Detector

150 Mbps to 12.5 Gbps BER Performance Test System for SDH/SONET

D3286 Error Detector

SDH/SONET frame synchronization for system evaluation

Region-specific error detection for SDH frame and ATM cell measurements

Burst data measurement for loopback testing

Auto-search function to adjust the most suitable timing and voltages

Data and clock monitoring outputs

FD drive for storing measurement results and setup data

Graphical user interface (GUI) environment for an easy-to-understand operating environment

Ultra-high-speed digital telecommunication networks are being built to accommodate the transmission of high-capacity information in the multimedia era of the future.

To evaluate and analyze O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems

Evaluating and analyzing O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems requires the use of high-speed, high-quality signal sources.

The D3186 Pulse Pattern Generator/D3286 Error Detector provides excellent performance!

The D3186 Pulse Pattern Generator/D3286 Error Detector delivers excellent signals with high speed, high quality, and a variety of error-detection features over the 150 Mbps to 12.5 Gbps operating frequency range.

In addition, the D3186/D3286. with its 8 M-bit mass memory and ADVANTEST’s unique frame pattern generation capability, is the next generation of BER test systems.

The D3186/D3286 is a new generation of BER performance test systems compatible with STM-1 (155.52 M bps) to STM-64 (9.95 Gbps) in SDH/SONET.

Generates SDH/SONET Frame Patterns Close to Actual Data

For evaluating optical transport equipment, E/O and O/E modules

Frame-level testing is required for O/OE and E/O testing of SDH/SONET systems.

The D3186 Pulse Pattern Generator, in addition to having a large WORD memory of 8 M bits in length, provides a frame-level test in the STM frame header section.

The D3186 Pulse Pattern Generator, in addition to having a large 8 M-bit WORD memory, provides the optional functions of inserting a WORD pattern into the header portion of the STM frame and inserting an arbitrary PRBS into the payload portion, thus realizing a test pattern that is very close to the actual data.

Of course, the D3286 error detector can measure errors in the header and payload sections separately.

In addition, the D3286 has a frame synchronization function and a specific area error measurement function, which can effectively support the location of the cause of the error.