Category: Advantest

The Cross Domain Analyzer U3800 Series is a vector and spectrum-signal analyzer with built-in two-channel RF input function. This is the industry’s first metrology tool that enables comparative measurement/analysis of the signals from two channels on the basis of their time, amplitude, phase, and frequency domains by simultaneous and synchronized measurement.

This Cross Domain Analyzer has the following features and functions:

● Two-channel RF input and wide frequency range

● The best-in-class time domain analysis bandwidth of 40 MHz

● Vector operation that allows composition/decomposition

U3800 Series allow the users to easily measure and analyze multiplexed/mixed/interfered www.abb-drive.com signals so that complex signal analyses that are conven

tionally difficult to perform, such as multipath analysis, electromagnetic field decomposition, and inter-circuit interference, can be carried out.

U3800 Series consists of analyzers applicable to a wide variety of fields such as broadcasting, telecommunication, and EMC.

A new field of RF measurement—Concept of Cross Domain

”We want to freely compare two RF signals in different analytical domains so that measurement and comparison of two signals that change with time, such as those in transient phenomena, modulating waves, and EMC noise can be achieved by means of a vector operation.” In order to satisfy such requirements, we have developed a measurement equipment that can easily measure, compare, and

analyze true momentary signals, which is difficult in the case of conventional measurement equipments, by equipping it with a two-channel phase-locked loop vector measurement function and operation function.

Key performance of the U3800 Series

● World’s first two-channel simultaneous/parallel measurement in the analysis bandwidth (maximum: 40 MHz)

● Vector comparison with high sensitivity and wide dynamic range (pre-amplifier equipped as standard)

● U3800 Series to support 9 kHz to 43 GHz of measurement frequencies

3 GHz Cross Domain Analyzer  U3841: 9 kHz to 3 GHz

8 GHz Cross Domain Analyzer  U3851: 9 kHz to 8 GHz

43 GHz Cross Domain Analyzer  U3872: 9 kHz to 43 GHz

The Single Scalable Test Platform

In the age of IoT, 5G and artificial intelligence, more than half of all the microchips manufactured in the world are tested by our equipment. As the industry’s leading manufacturer of automated test systems for semiconductor devices, we continuously revolutionize market standards and enable customers to shape their digital future.

Our V93000 platform addresses the latest industry challenges and enables applications like Artificial Intelligence (AI) & High-Performance Compute (HPC), medical devices, Advanced Driver Assistance Systems (ADAS), making the world safer, faster and our lives easier.

Thanks to the platform’s scalability and compatibility over www.abb-drive.com multiple generations, V93000 is future proof and saves cost. The all-in-one platform covers a variety of different solutions like RF, digital, power and analog.

Large Installed Base

Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high-volume manufacturing. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Outsourced IDMs and fabless companies find the V93000’s test capacity installed in all major OSATs worldwide.

V93000 EXA Scale – The New Generation

The V93000 EXA Scale™ SoC Test Systems are targeted at advanced digital ICs up to the exascale performance class. The EXA Scale generation of the V93000 provides solutions that enable new test methodologies to meet the challenges of these advanced digital devices and deliver lower Cost-of-Test (CoT) and faster Time-to-Market (TTM).

Today’s most advanced semiconductor processes allow for technology transformations that enable real-time integration of data from a countless number of sources such as IoT and handheld devices, automobiles and large servers to name a few. As mobile processors, Advanced Driver Assistance Systems (ADAS) processors, high-performance computing (HPC) and artificial intelligence (AI) ICs evolve, the amount of data being processed and the device power requirements continues to grow exponentially. Along with these advancements, new testing challenges, including exploding scan-data volumes, extreme power requirements, fast yield-learning, high pin-count, and high-multisite configurations need to be addressed. Advantest’s new V93000 EXA Scale generation addresses these challenges with innovative advancements on the proven V93000 architecture.

The V93000 EXA Scale system employs Advantest’s patented Xtreme Link technology, a communication network designed specifically for automatic test equipment (ATE). The technology provides high-speed data connections, embedded computing power, and instant card-to-card communication.

Advantages and Benefits

Platform scalability enables outstanding device portfolio coverage and provides CoT advantages in one single scalable test platform

The widest range of compatible tester configurations, that scale from small footprint engineering systems to very high pin count wafer sort and final test systems for high volume manufacturing (HVM),

The broadest application coverage in the industry, from High Performance Compute (HPC) & AI, to mobile & RF, to automotive & industrial.

Compatibility across tester generations maximizes test capacity utilization and investment protection of test hardware

Probe card and device-under-test (DUT) boards, and test programs can be utilized across V93000 generations to provide:

Fast qualification and transition to new capabilities

Flexibility to efficiently utilize available test capacity

Investment protection for test hardware (systems, instruments, probe cards and final test interface hardware) and test engineering infrastructure, knowledge and training

Integration technology leadership driving ATE Innovation through Moore’s Law

The innovative test processor-per-pin and environment friendly water-cooled architecture, which has endured over four generations of the V93000 is delivering industry leading pin density, reliability, and measurement stability & repeatability of digital, analog and RF instruments.

Providing superior solutions that are optimized for performance and throughput

EXA Scale Portfolio

RF channel card’s innovative architecture enables unprecedented multi-site and in-site parallel measurements for high-volume, low-cost testing of current and next-generation RF devices

The high-growth market for wireless communications presents several daunting test challenges. The wide variety of RF-based communication protocols demand test equipment that is both highly versatile and extendible to provide a path for testing the coming generation of 5G communications. The equipment also must deliver a low cost of test and high productivity to enable much faster time to market for new IC designs.

ADVANTEST’s Wave Scale™ generation of RF channel cards enables the V93000 single scalable platform to achieve industry leading parallelism and throughput in testing virtually all RF and mixed-signal semiconductor devices used in wireless communications. These cards empower the V93000 platform to conduct highly parallel multi-site and in-site parallel testing, achieving unprecedented performance.

All-in-One Test Solution

The flexible Wave Scale RF card is capable of testing the RF SoCs that drive LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT wireless applications.  In addition to handling today’s market requirements, it is designed with the extendibility to address projected technology changes toward the future of 5G networks.

Multi-Site and In-Site Parallel Testing

The Wave Scale RF uses an advanced architecture, allowing it to exceed the capabilities of traditional RF test solutions.

While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT.  It combines this unique in-site parallelism with octal-site or more testing capabilities and high www.abb-drive.com multi-site efficiency to dramatically reduce the cost of test for complex RF devices.

High-Volume Capabilities

With four independent RF subsystems per board, the Wave Scale RF card can handle the individual stimulus and measurement frequencies needed to test the full spectrum of devices used in wireless communications. Each RF subsystem has eight ports, which fan out the RF signal, and up to four independent measurement instruments.

With this configuration, each of the four RF subsystems can be used across as many as eight sites to run receiver and transmitter tests simultaneously with all internal RF paths also tested in parallel.

The system can handle a total of up to 32 sites per card for IoT, Bluetooth and other devices. The innovative V93000 test processor controls and synchronizes the parallel and independent operation of all instruments.

Each of the card’s 32 RF ports can support up to 6 GHz for a bandwidth of 200 MHz. Additionally, internal loopback and embedded calibration standards contribute to the system’s highly integrated architecture.

Description:

The Advantest D3186 is a high-performance pulse pattern generator that generates seven types of pseudo-random (PRBS) patterns from 27-1 to 231-1. programmable (WORD) patterns.

Programmable (WORD) patterns, up to 8M bits, or frame patterns for SDH or SONET structures, at speeds ranging from 150 Mb/s to 12 Gb/s.

In addition, by combining the D3186 with the D3286 BER detector, it is possible to build a system for evaluating the BER of ultra-high-speed optical communication devices and compound semiconductors.

With the D3186. you can choose a built-in high-precision www.abb-drive.com synthesized clock generator. Sixteen types of frequency memories are provided for fast frequency setting.

For PRBS mode, the marker ratio can be changed between 8 values. Payload type can be selected from WORD, PRBS and CID for FRAME mode.

ALTERNATE mode is available and can be switched on 2 modes (WORD and FRAME) to perform measurements.

Various types of applications are available by using differential data output, differential clock output, and fixed amplitude clock output.

Amplitude, offset, and terminator conditions can be set for differential data output and differential clock output, respectively. The terminator condition can be selected from TO 0 V, TO -2 V, or AC coupling.

Starting from a motor-driven delay block, the phase of the clock output can be varied in 1 ps resolution steps up to ± 400 ps.

When using the D3186 in combination with the D3286 error detector for error measurement, the master-slave function interlocks their modes.

GPIB functionality allows full remote control, making it easy to build measurement and test systems. The built-in floppy disk drive can store/recall the contents of set conditions and mode settings.

Avoid using the D3186 in dusty areas or where the unit is exposed to direct sunlight or where corrosive gases are generated.Always use the D3186 in an area with an ambient temperature of 0 to 40 degrees Celsius and a relative humidity of 40% to 85%.

Avoid excessive mechanical shock to the D3186. Since the D3186 has an exhaust cooling fan, be sure to leave a space of 10 centimeters or more between the rear panel and the wall. Also avoid blocking the air inlet holes on both sides of the D3186.

Supply voltage should be 90 to 132 VAC or 198 to 250 VAC, 48 to 63 Hz. 100 V and 200 V power circuits switch automatically. Use a power supply with sufficient capacity since the unit consumes a maximum of 550 VA.

Key Points:

Built-in high-precision synthesized clock generator

16 frequency memories are provided for fast frequency setting.

For PRBS mode, the marker ratio can be changed between 8 values.

ALTERNATE mode available

GPIB Features

Built-in floppy disk

Excellent waveform quality

Generation of SDH/SONET frame patterns

Large memory

Multi-channel output

Output waveform crosspoint variables

Burst signal output

Fiber optic loop test

Master/Slave

Specifications:

Frequency range: 150 MHz to 12 GHz (option 10), 150 MHz to 12.5 GHz (option 13)

Frequency setting resolution: 1 kHz

Frequency stability: ±10 ppm/year

Load impedance: 50 ohms

Frequency accuracy: 0.01 %

Output impedance: 50 ohms

Operating temperature: 0°C to +40°C, +20°C to +30°C (Option 72)

Operating humidity: 40% to 85% RH

Storage temperature: -20°C to +60°C

Storage humidity: 30% to 85% RH

Power supply: AC 100 V to 120 V, AC 220 V to 240 V, 48 to 63 Hz

Power consumption: 550 VA maximum

Mass: max. 42 kg

External dimensions: approx. 310 (H) X 424 (W) X 550 (D) mm

In the field of radio communication which supports the in-creasingly information oriented world,

the role played bymicrowave and quasi-millimetric waveband communicationis increasing year by year.

R3272 is a high-function portable spectrum analyzer whichcan be operated simply to do spectrum analysis of thesemicrowave and quasi-millimetric wavebands.

It has a fre-quency range of 9 kHz to 26,5 GHz (or up to 60 GHz using anexternal mixer), an input range of +30 dBm to -120 dBm,

anamplitude display with a dynamic range of 100 dB and aresolution bandwidth of 300 Hz.

A frequency counter with a 1Hz resolution is also provided.

The R3272 is an ideal spectrui analyzer for wave and www.abb-drive.com spuriousmeasurements in microwave circuits and satellite communica-tion.

Description:

A spectrum analyzer is a broadband, very sensitive receiver.

It operates on the principle of a “super-aberrant receiver”, converting higher frequencies (usually ranging up to tens of gigahertz) into measurable quantities.

The received spectrum is slowly scanned through a series of pre-selected frequencies, which are converted to measurable DC levels (usually on a logarithmic scale) and displayed as such on the Advantest R3272’s CRT.

The CRT displays the received signal strength (y-axis) versus frequency (x-axis).

.Compact, Lightweight (16.5 kg) MicrowaveSpectrum Analyzer

.Wide Frequency Range: 9 kHz to 26.5 GHz

.Independent Function Keys Make OperationSimple

.High Stability Narrow Band Sweep Made PossibleBy DDS (Direct .Digital Synthesizer) Technology

.Newly-Developed High-Speed Settling SynthesizerGreatly Improves .Measurement Throughput

.Large, Easy-To-Read TFT Color LCD Display

.IC Memory Card, 2 SlotsJEIDA Ver. 4.2/PCMCIA 2.1

A Microwave Spectrum Analyzer With MorePortability

The R3272 was designed as an ‘active microwave spectrumanalyzer’,meeting MIL standards for shaking, dropping andshocks, It has a robust, compact design, measuring 178 (H)x350 (W)x420 (D) mm and weighing 16.5 kg. Its lightness andcompactness make it much less ofa burden when transportingit to a relay station or other site.

.User Friendly Panel Settings

Simple operation is another design concept of the R3272. Itemploys a TF’T color LCD display in order to show a variety ofinformation reliably,. The frequently used BW, INPUT ATT andSWEEP TIME setting parameters, as well as the OBW, ACP andHARM measurement finctions which are indispensable whendoing transmitter characteristics tests have been given inde-pendent keys on the front panel. This arrangement allowsdirect operation of these functions.

■ Synchronized 2-Channel Generation, Measurement

■ Measurement Resolution of 1 µV, 10 fA (SMU220-2), 100 pA (SMU62-20)

■ Source Range ±220 V, ±2 A (SMU220-2, 2.4 W)/±62 V, ±20 A (SMU62-20, 140 W)

■ Minimum Pulse Width 100 µs, Minimum Step 700 µs

R6245/6246 DC Voltage/Current Sources/Monitors

The R6245/6246 Series are DC voltage/current sources and monitors having source measurement units (SMUs) with 2 isolated channels.

The series covers wide source and measurement ranges.

It is ideal for measurement of DC characteristics of items ranging from separate semiconductors such as bipolar transistors,

MOSFETs and GaAsFETs, to ICs and power devices.

Further, due to the increased measuring speed and synchronized 2-channel measurement function,

device I/O characteristics can be measured with precise timing at high speed which previously difficult to accomplish.

Due to features such as the trigger link function and the sequence programming function which automatically performs a series of evaluation tests automatically, the new R6245/6246 enable much more efficient evaluation tests.

■ High Measurement Accuracy of ±620000 Columns, 0.02%

High Measurement Resolution of 1 mV, 10 fA

■ High source Accuracy of ±62000 Columns, 0.03%

Wide source Range of ±220 V, ±20 A

■ High Throughput, 0.8 V/µs (At Current Measurement Range of www.abb-drive.com 6 mA or more)

■ Wide Variety of Measurement Functions

• 4 Phenomenon Output (Source/Sink)

• Up to 5 V Remote Sense

• Minimum Step 700 µs Sweep Measurement (Generation, Measurement, Data Storage)

• Range Switching without Discontinuous Output

• Pulse Measurement with Minimum Pulse Width of 100 µs

• Synchronized 2-Channel Measurement Function

• Search measurement function

External measurement input: When the current range is measuring

an applied voltage at the MEASURE INPUT terminal, the

measured voltage is displayed in the set current range

Voltage measurement accuracy ±(0.02% of reading + 120 µV)*1

Current display accuracy ±(0.375% of reading + 7.6 µA)*2

Maximum allowable applied voltage ±250 V peak max.

External analog input: When an external analog signal is added from the ANALOG INPUT terminal, the output added to the generation value of the set generation range can be obtained.

2 types of gain can be selected. Input and output ranges are decided by the source range.

Voltage source accuracy ±(0.16% of setting + 3.8 mV)*1

Current source accuracy ±(0.5% of setting + 10 µA)*2

Maximum input frequency FAST: 10 kHz, SLOW: 1 kHz, at ±6 V

output voltage, 6 mA to 6 A current range, full-scale

Maximum allowable applied voltage ±10 V peak max.

Input resistance Approx. 10 M Ω

V monitor: Voltage between the HI SENSE and LO SENSE terminals

divided at ±6.2 V full-scale is output at V MONITOR terminal

Monitor accuracy ±(0.01% of reading + 1 mV)*1

Output resistance 500 Ω max.

The R6144 is precision voltage and current generators ideal for evaluation of precision circuits and parts as well as calibration of temperature controllers.

The units use a time-sharing D/A conversion circuit which provides excellent linearity and stability. Settling time and output noise are greatly reduced for higher reliability, allowing construction of a high throughput measurement system.

GPIB and BCD parallel interfaces are provided as standard features, enabling compatibility with a wide range of host devices such as personal computers, sequencers or general purpose I/O interfaces.

■ Up to 32 V/160 mA Voltage, Current Output

■ High Resolution (1 µV/100 nA steps)

■ High Accuracy Guaranteed For 6 Months: 0.03% (Voltage), 0.035% (Current)

■ Low Noise Increases Measurement Reliability: 3 mVp-p, One-Fifth of Previous Models’ Noise Level

■ Reduced Settling Time Enables Improvements In Throughput: 50 ms, www.abb-drive.com One-Third of Previous Models’ Time

■ Built-In 160-Step Memory

■ All-Digit Continuous Variable Sweep Function Enables Wider Range of Measurement Applications

■ Programs Written For Previous Model (TR6142) Can Be Used Without Modifications

Basic functions

Basic functions are reinforced so that R3132/3162 can be used in various fields.  For example, the internal automatic calibration function guarantees the total level accuracy of ±1.5dB, level correction factor can be stored in the internal memory, DDS is employed to improve frequency reading accuracy, and frequency span error is lowered to less than 1%.

The R3132/3162 offer wider dynamic range and lower 2nd and 3rd distortion by improving 1dB compression point.

As a result of increasing the sweep repetition cycles by improving the synthesized local oscillator, 20 traces/second (typ.) data rewriting becomes possible, enabling far more real-time waveform measurement.

high speed GPIB increase, the throughput of automatic measurement.

For many applications

For EMI precompliance measurement, 6-dB bandwidth filters for 9kHz, 120kHz and 1MHz as well as QP detector are equipped as standard.  Optional 200Hz narrow RBW filter can be added.

For high-speed time domain measurement function which is indispensable for www.abb-drive.com mobile communications, optional 50µs sweep is effective.

By using the double-screen display function, you can specify the rising/falling edge of TDMA waveform and display the magnified image.

The R3132/3162 series spectrum analyzer has ACP and OBW operation function indispensable for evaluating the transmission characteristic of radio system.

With various other functions such as AUTO TUNE, 1Hz resolution frequency counter, dBc/Hz, %AM, and PASS/FAIL test by limit value, the R3132/3162 series can easily perform several types of measurements.

Even for signals which are lower in level than the average noise level, the preamplifier ensures level calibrated, high-accuracy measurement.

For measuring the attenuation characteristic of filters or the frequency characteristic of cables, etc., built-in tracking generator is available as option.  Because the output level can be set in a wide range, it is possible to measure amplifier gain, frequency response, etc.

Easy-operation interface

The high-resolution, 6.5-inch TFT color LCD realizes easy-to-see display of data.  VGA output is provided for external display.

Measured waveform data and setting condition can be saved in or recalled from the internal memory.  Using the floppy disc drive which is equipped as standard, you can manage more number of measurement data.  Text data or Bitmap data on floppy disc are also useful for making documents on a personal computer.

As the hard-copy function is provided to ESC/P. ESC/P-R and PCL,  measured data can be printed out on general-purpose printers.

GPIB and RS232 are equipped as standard.

The R3172 and R3182 are low-cost portable spectrum analyzers capable of performing direct input measurements at a maximum frequency 26.5 and 40 GHz respectively.

Adopting newly designed RF circuitry, both the R3172 and R3182 aim for improved basic performance with their 40 GHz direct input capability. Further, the R3172 and R3182 achieve “best-in-class” performance for average display noise levels of -104 dBm (at 26.5 GHz, RBW 1 kHz) and -106 dBm (at 40 GHz, RBW 1kHz) respectively, and SSB phase noise levels of -91 dBc/Hz (at 26.5 GHz, 20 kHz offset) and -85 dBc/Hz (at 40 GHz, 20 kHz offset) respectively.

Operating frequencies for radio communications have increasing tendency to shift to higher frequencies. Accordingly, the R3172 and R3182 have been developed as personal-use spectrum analyzers capable of use in a wide range of applications from development to manufacturing of high frequency modules, devices, etc.

Description:

The R3172 spectrum analyzer employs a synthetic local method that enables users to perform highly stable and accurate spectrum analysis.

The Edelweiss Test R3172 is a spectrum analyzer capable of performing www.abb-drive.com direct input measurements.The R3172 has a frequency range of 9 kHz to 26.5 GHz.

The portable and compact R3172 improves performance when adding newly designed RF circuits.

In addition, the R3172 achieves best-in-class performance at an average display noise level of -106 dBm (426.5 GHz, RBW 1 kHz) and SSB phase noise level (26.5 GHz, 20 kHz offset).

The R3172 is designed to withstand a certain amount of noise on the AC power line and should be used in low noise areas. A noise reduction filter helps avoid ambient noise.

The R3172 has an exhaust cooling fan on the rear panel and a front-facing exhaust port on the bottom. Users are advised not to block these areas as the resulting internal temperature rise can affect measurement accuracy.

The R3172 is safe for use at a maximum altitude of 2000 m above sea level, installation category II, contamination level 2.

To remove dirt from the exterior of the spectrum analyzer, wipe or brush the surface with a soft cloth or small brush. Hardened dirt can be removed with a cloth that has been soaked in water containing a mild detergent.

The R3172 was developed as a personal use spectrum analyzer capable of being used in a wide range of applications.

Key Points:

High-speed, high-precision scanning

Wide dynamic range

Frequency counter function with a resolution of 1 Hz.

Power measurement function

Auto-tuning function

3.5-inch floppy disk drive

Supports ESC/P, ESC/P-R and PCL compatible printers.

Remote control capability

High-precision color LCD display

Memory card function

BASIC controller comes standard

Voice demodulation using the internal speaker is possible

Portable system with large CRT monitor

Specifications:

Dynamic range: +30dBm to -132dBm

Frequency range: 9 KHz to 26.5 GHz

Frequency span: Zero, 1 kHz to 26.5 GHz

Input impedance: 50 ohms

Resolution bandwidth: 1 KHz to 3 MHz

Video bandwidth: 10Hz to 3MHz

High input sensitivity: -145 dBm

Operating temperature: 0 to +50°C (85% relative humidity or lower)

Storage Temperature: -20 to +60°C (85% RH or lower)

Power consumption: <200 VA

Power supply: 100 VAC – 100 to 120 VAC, 50 to 60 Hz

200 VAC – 220 to 240 VAC, 50 to 60 Hz

Dimensions: approx. 424 (W) x 177 (H) x 300 (D) mm

Mass: <16 kg

The R3267 series spectrum analyzers are high-performance, versatile analyzers (with basic features) that respond to customer needs for future public land mobile communications systems with high C/N ratios.

The Advantest R3267 spectrum analyzers provide accurate, repeatable measurements of high-quality digital signals in the 2GHz band ± within 1% frequency span accuracy and -154dBc/Hz dynamic range (typical).

In addition, its 10Hz to 10MHz resolution band with filters is capable of performing 70dB (typical, 5MHz offset) ACP measurements over W-CDMA, making it ideal for testing wideband signals.

Finally, the R3267 has a frequency range of 100Hz to 8GHz, allowing even high-frequency systems to be fully measured.

The front panel of the R3267 consists of the Display section, Power Switch/Connector section, Floppy Disk Drive section, Measurement section, Marker section, Save/Recall section, Display Control section, ENTRY section, REMOTE section, Control section, and www.abb-drive.com Option section.

Remove dust from the exterior of the R3267 by wiping or brushing the surface with a soft cloth or small brush. Use a brush to remove dirt from around the panel keys. Hardened dirt can be removed with a cloth that has been soaked in water containing a mild detergent.

Normally, cleaning the display filter from the front is sufficient. However, if the inside of the filter or the LCD surface is dirty, you can detach the screen filter from the R3267 series by removing the two screws on the front and pulling forward on the right part of the filter. Clean the filter with a soft close.

■ Wide frequency range:

R3264:9kHz to 3.5GHz

R3267:100Hz to 8GHz

R3273 :100Hz to 26.5GHz

26.5GHz to 60GHz (External mixer option)

Synchronization available up to 325 GHz

■ Resolution bandwidth (RBW):

10 Hz to 10 MHz, 5MHz (analog)

1 Hz to 100 Hz (digital)

■ Wide dynamic range:-145dBc/Hz (2GHz band, typ.)

70dB or better for W-CDMA ACP measurement  (5MHz offset, typ.)

■ 1µs fast zero-span sweep

■ Simplified, Automated measurements for mobile communications

■ Digital modulation analysis options for 1G, 2G, and 3rd

Generation : PHS, PDC, IS-136. GSM, DECT, EDGE, GPRS IS-95. W-CDMA/3GPP, cdma2000. Bluetooth

R3264/3267/3273 Spectrum Analyzer

The R3264/3267/3273 are high-performance multifunction spectrum analyzers with the basic functions necessary to meet the demand for wider frequency range and a higher C/N ratio for next-generation digital mobile communications.

■ 10MHz resolution bandwidth for wide signal range Offers an RBW of 10MHz enabling accurate analysis of the rise and fall characteristics of high-speed amplitude

modulated signals. The analog RBW extends down to 10Hz providing wide dynamic measurement.

Since the R3264/3267/3273 also support the digital resolution bandwidth (RBW) from 1 Hz to 100 Hz, they are suitable for high-resolution measurement.

■ Enables measurement with wide dynamic range To maximize the dynamic range of input signal amplitude, the R3264/3267/3273 have inputs with low distortion characteristics and reduced average noise levels. A wide dynamic range of measurement of -145dBc/Hz (at 2GHz, typ.) with a 0dBm signal input.

■ Low distortion design ideal for inter-modulation measurement Two-signal 3rd order inter-modulation distortion is essential for evaluating RF modules and wireless trans

mission devices. To provide this function the spectrum analyzer itself must have a low modulation design. The R3267 offers a high performance of -90dBc or less in the 1.6GHz to 8GHz range.

■ Advance digital modulation analysis (option)

The R3264/3267/3273 support both spectrum analysis and modulation analysis in a single unit. In addition to major existing mobile communication standards, the R3264/3267/3273 can also support advanced standards such as W-CDMA/3GPP and cdma2000.