Category: Advantest

550 to 1750 nm

Optical Spectrum Analyzer

Low polarization dependence

For optical amplifiers

Brief Description

The Q8383 is an advanced spectrum analyzer (Advantest) with a two-pass monochromator and very low polarization dependence.

Thanks to a special method, values of ±0.05 dB are guaranteed, with typical values as low as 0.02 dB.

Together with the high accuracy of the resolution bandwidth, the Q8383 can be used to perform www.abb-drive.com precise power measurements.

All of these features make the Q8383 an ideal measurement instrument for erbium-doped fiber amplifiers (EDFAs).

By simply comparing the signal at the input of the amplifier with the signal at the output of the amplifier, special measurement functions can be used to determine the noise figure, gain and spontaneous emission.

Of course, all these functions are also of great advantage when measuring laser diodes, light emitting diodes and other light sources.

The curve fitting function directly displays electroluminescence characteristics by fitting a Gaussian distribution to the emission spectrum.

This is very useful for measuring Erbium Doped Fiber Amplifiers (EDFA) and Light Emitting Diodes. A special feature for pulsed light allows measurements of fiber optic rings and soliton transport systems. Internal or external triggering is possible.

Measurement time is 0.8 seconds for a span of 200 nm and varies with the span.

Broadband light sources with a resolution of 5 nm have the highest sensitivity, while narrowband light sources (lasers) can be reliably analyzed down to the noise level even with a narrow resolution bandwidth.

The normalization function combined with the white light source allows direct measurement of transmission and loss characteristics of filters and fibers.

Key Features

– Sensitivity -92 dBm

– Polarization correlation ±0.05 dB

– Resolution bandwidth accuracy ±2

– Power Measurement

– Pulsed light measurement

Operation

In addition to amplifier analysis, a variety of display modes are available, such as

– Overlay display,

– Comparison with memory contents,

– Display of two independent graphs (split screen),

– Power meter function,

– Use of multiple markers,

– Normalized and direct readout of transmission loss and

– Automatic bandwidth analysis (e.g. measurement of half-value widths based on RMS and envelope methods),

– Curve fitting over the IEC/IEEE bus and many other features facilitate operation of the analyzer and simplify analysis.

A standard internal disk drive is used as a storage medium. Stored binary data can be analyzed with the appropriate program under MS-Windows or copied to a file and printed out.

The high-speed built-in thermal printer prints out a hard copy of the measurement results with all setup parameters in less than 10 seconds. The built-in high-speed thermal printer prints a hard copy of the measurement results with all setup parameters in less than 8 seconds.

Optical Measuring Instruments and Optical Device Test Systems

Significant progress has been made in the research and development of ultra-high-speed optical communications and high-density wavelength-division-multiplexed optical communications (Dense-WDM), and these technologies are increasingly being used in industry.

In the field of research and development, amplitude characteristics, chromatic dispersion characteristics, and group division multiplexing characteristics are of utmost importance,

In the R&D field, amplitude characteristics, chromatic dispersion characteristics and group delay characteristics of optical devices or optical subsystems need to be measured with high optical frequency resolution.

Devices that require this feature include AWGs, fiber grating filters, and dispersion compensators.

In particular, since dispersion characteristics can hinder the improvement of optical communication bit rates, dispersion values must be reduced or managed.

The Q7750 optocope (optical network analyzer) is a revolutionary device for measuring optical transmission characteristics.

It can measure the amplitude/dispersion/group delay characteristics of incident and reflected light from optical devices at high speed and high resolution over the optical carrier frequency range.

In addition, it can easily measure various chromatic dispersion characteristics, including the zero-dispersion characteristics and dispersion slope characteristics of dispersion-shifted or non-zero-dispersion fibers.

Measurement using the phase-shift method enables high optical frequency resolution and wide dynamic range.

Batch Measurement of Optical Transmission Characteristics in the Optical Carrier Frequency www.abb-drive.com Range The Q7750 is equipped with a variable wavelength light source.

The Q7750 is equipped with a variable wavelength light source that enables simultaneous measurement of transmission and reflection characteristics in the optical carrier frequency range by scanning a series of wavelengths (optical frequencies) (S21 and S11 as S-parameters).

The measurement parameters are shown in the table below. These parameters can be measured simultaneously in a single scan.

High optical frequency resolution

Optical frequency resolution: up to 50 MHz (converted to 0.4 pm according to wavelength)

The Q7750 has a maximum optical frequency resolution of 50 MHz, which enables measurements in the field of ultra-high-resolution optical carrier frequencies that were not previously possible.

Amplitude and chromatic dispersion characteristics of optical devices for DenseWDM or Ultra-Dense-WDM can be easily measured (channel steps: 100 GHz, 50 GHz, 25 GHz, etc.).

Selectable wavelength spans from 70 nm (maximum) to approximately 0.1 nm (minimum).

High-speed measurement

Measurement time Approx. 6.7 ms (per measurement point) Approx. 4 seconds (within the specified span) The interval between scans (measurement time) is approx. 4 seconds.

This means that the Q7750 can complete a measurement in 4 seconds, whereas the previous measurement process took several tens of seconds.

If the measurement time is too long, accurate results may not be obtained because the characteristics of the device under test may change due to environmental conditions such as temperature.

The Q7750 completes measurements in a short period of time, ensuring high-speed, accurate measurements that are unaffected by the temperature characteristics of the device under test.

Evaluating Optical Narrow Bandpass Filters for Wavelength Division Multiplexing

– High resolution: 0.01 nm (at 1.55 µm) 0.001 nm (at 0.5 µm)

1 GHz (in optical frequency mode)

– High wavelength accuracy: ±0.01 nm

– Measurement speed: 1 to 3.5 seconds

– Coherence analysis range: ±165 mm

ADVANTEST’s own interferometer type

Wavelength resolution of 0.01 nm, wavelength accuracy of ±0.01 nm in the 1550 nm band (resolution of 1 GHz, accuracy of ±1 GHz in optical frequency mode)

The Q8347 spectrum analyzer enhances the performance of spectrum analyzers using Fourier Spectrum Systems and Michelson interferometers.

The Q8347 has a wavelength resolution of 0.01 nm in the 1550 nm spectral band and a wavelength accuracy of ±0.01 nm (1 GHz resolution and ±1 GHz accuracy in optical frequency mode).

In addition, the Q8347 accurately measures each wavelength of an optical wavelength-division-multiplexing (WDM) transmission signal by separating the spectra.

It is particularly useful for evaluating the characteristics of optical narrow bandpass filters used for www.abb-drive.com WDM, such as AWGs and fiber gratings.

In addition, the Q8347 can be used to analyze chirped signals for LD and Soliton transmission.

500 nm band resolution of 0.001 nm Higher resolution can be achieved at shorter wavelengths.

With a resolution of 0.001 nm in the 500 nm band, the Q8347 is best suited for analyzing blue LDs.

Trend Monitoring Function

Input power and wavelength can be displayed as a digital readout, as well as a time-domain trend graph.

Printer and floppy disk drive are standard The system is equipped with a high-speed thermal printer capable of reproducing the display in less than 8 seconds.

In addition, the system is equipped with a floppy disk drive using MS-DOS for easy data storage and analysis.

In addition, data is stored in text format for easy analysis and processing on a personal computer. In addition, the stored data can be subsequently scaled.

Displayable optical frequency

In addition to the normal wavelength display mode, the measurement spectrum can also display the optical frequency.

Since light in terahertz units can be read directly, this is useful for measuring optical wavelength division multiplexing and chirping from LDs, as well as for analyzing Soliton transmission systems.

Coherence analysis of ±165 mm

Because the Q8347 uses a Michelson interferometer, the system is capable of performing coherence analysis.

This feature makes it easy to evaluate the noise rejection performance of a disc LD. In addition, the travel of the interferometer can be greatly increased to allow analysis over a range of ±165 mm.

As a result, more detailed analysis can be performed in addition to the conventional secondary maximum peak (α value).

Curve fitting function

The Q8347 offers sech2 and Gaussian function curve fitting. Therefore, it can be used for spectral analysis of soliton transmission systems.

List display

The peaks of spectrum or coherence data can be displayed as digital data containing up to 200 points.

The separation and level of each channel of an optical WDM transmission system can be seen at a glance.

High Accuracy, High Sensitivity, High Speed

Optical power meter

Various optical sensors and light sources are available High accuracy :

± 2.5% (at calibration point)

± 4.5% (over the entire wavelength range)

Linearity : ± 0.5%

Low polarization dependence: 0.003 dBp-p

High sensitivity: -94 dBm

High power input level: +27 dBm

High-speed measurement: sampling rate of 100 times/second

Flexibility to meet the diverse needs of users for optical power measurement

Features

Flexible combination – dual-channel plug-in system.

The Q8221 utilizes a dual-channel plug-in system. www.abb-drive.com Various types of optical sensors and light sources are available as plug-in units. Both channels can be used independently or simultaneously. By using the desired combination of optical sensors and light sources, the Q8221 can handle a wide variety of applications.

High measurement accuracy.

Ensure accuracy over the entire power and wavelength range.

The Q8221’s optical sensors ensure a high accuracy of ±2.5% at the calibration point (short-wavelength sensors: Q82214 calibrated at 780nm; long-wavelength sensors: Q82208. Q82215. and Q82216 calibrated at 1300nm; Q82227 and Q82232 calibrated at 1550nm). In the broadband wavelength region, they ensure ±4.5% accuracy by compensating for the sensitivity curve at each sensor wavelength. In the broadband wavelength region, they ensure ±4.5% accuracy by compensating the sensitivity curve at each sensor wavelength. In addition, a linearity of ±0.5% is ensured. Not only in the calibration point, but also in the broadband wavelength region and at the level to be measured.

High Sensitivity Sensors

Noise level: -94 dBm.

The Q82208 and Q82232 optical sensors achieve high sensitivity by cooling the InGaAs photodiode. the Q82208. in particular, achieves -94 dBm. all three types are capable of measuring high power up to +10 dBm with high linearity. These sensors meet a wide range of user requirements for polarization correlation, return loss, and sensor type. They meet a wide range of measurement requirements.

High Power Input Optical Sensors (Q82227)

Maximum input power: +27 dBm

The Q82227 is suitable for long wavelength, high sensitivity and high power light. The sensor is capable of measuring optical inputs up to +27 dBm. Therefore, it is suitable for measuring the output of fiber-optic amplifiers, pump sources for fiber-optic amplifiers, and high-output devices (e.g., LDs for optical CATV). In addition, the Q82227 has a noise level of -80 dBm, so it can be used for measurements requiring a wide dynamic range.

Low polarization-dependent optical sensor (Q82232): 0.003 dBp-p or lower

The high-sensitivity Q82232 optical sensor has a polarization dependence as low as 0.003 dBp-p. Used in conjunction with the Q8163 polarization scrambler, it can be used for high-speed, high-precision PDL measurements of optical devices.

Low Reflection, High Return Loss Sensors

Adapters with Minimal Reflection

If the input light is reflected back, the effect on the system can lead to inaccurate measurements. the Q82208 optical sensors use optical fibers with beveled polished ends to suppress reflections (return loss of 50 dB or more). the Q82208 is designed for use in optical devices with high speed and high accuracy PDL measurements. the Q82208 is designed for use in optical devices with high speed and high accuracy. When using PC-polished connectors, 45 dB or more return loss can be obtained by using a low-loss, high-return-loss adapter (typical return loss without this adapter is 14 dB). The sensor is suitable for fibers with core diameters of 10 μm and NA values of 0.19 or less, making it suitable for measuring dispersion-shifted fibers. FC, SC, ST, MU, LC, and plug-in connectors are available.

Options available.

High-resolution measurement.

Displays 0.001 dB/0.0001 dB GPIB output.

Absolute power measurements (dBm) and relative power measurements (dBr) are displayed with 0.001 dB resolution.

During GPIB output, the data output resolution is 0.0001 dB.

High-speed, high-throughput measurements.

Up to 100 measurements/second

For all sensors, the Q8221 has a sampling rate of 100 times per second and a ranging rate (time required to move to different ranges) of up to 500 ms (20 ms minimum). In addition, the ability to transmit GPIB outputs at a high speed of 100 times per second dramatically increases the throughput of the production line.

Recording Functions, PDL Measurement Functions

The Q8221’s A and B channels can independently store data containing 400 points. In addition, the stored data can be output directly to an external plotter in the form of a graph. In addition, the Q8221 displays the maximum value, minimum value, and the difference between the maximum and minimum values of the measured data, making PDL measurements with the Q8221 very simple.

At 8.5 kg, the U3661 is the world’s lightest microwave spectrum analyzer, meeting the diverse needs of a wide range of communication systems.

The U3661 not only enhances the basic performance of a spectrum analyzer, but also includes many standard features such as power calculation and high-speed scanning.

The U3661’s compact, lightweight design and three-way power supply system, including batteries, make it the perfect analyzer for field measurements.

The unit also has a built-in RC232 interface for connection to a personal computer, facilitating flexible data management using standard memory cards.

Excellent basic performance and measurement applications

Wideband scanning

The U3661 can continuously scan a frequency bandwidth from 9 kHz to 26.5 GHz on a single screen. Harmonic measurements or spurious signal measurements over a wide bandwidth can be easily compared relative to the fundamental.

Outstanding signal purity

The U3661’s local oscillator is equipped with a precision synthesizer that achieves a signal purity of -100 dBc/Hz (at frequencies ≤3.2 GHz and an offset frequency of 10 kHz). It meets a variety of needs, from adjacent channel leakage power measurements at radio facilities to microwave equipment evaluation.

Occupied frequency bandwidth

The U3661 calculates the bandwidth for a specified power ratio based on the measured spectrum data and then displays it with a marker. In addition, it displays the occupied frequency bandwidth (OBW) and carrier frequency (FC).

Adjacent Channel Leakage Power

The U3661 obtains the total power from the measurement data on the screen. It then integrates the www.abb-drive.com power over the specified bandwidth (BS) to obtain its ratio to the total power.

ACP POINT and ACP GRAPH measurement methods can be selected.

Various Measurement Applications Power Measurement Functions

Average power

Digital mobile communication systems use modulation patterns that can handle signals with large amplitude variations.

Therefore, we have included an average power calculation function that allows power measurement of signals with amplitude variations.

Total Power

For spread spectrum signals used in CDMA or wireless LANs, the total power measurement function is essential. This function consists of two modes: a channel mode for measuring the in-band power specified in the measurement window, and a total power mode for measuring the total power over the entire measurement span.

1 Hz resolution frequency counter

Simply by adjusting the counter markers according to the spectrum, the U3661 can display a frequency counter with a minimum resolution of 1 Hz. This feature is very useful in multicarrier frequency measurements such as mobile radio or CATV systems, where it is difficult to do so with conventional frequency counters.

Multiple Markers

Up to six markers can be set up on a single screen, and a corresponding marker can be assigned to any frequency. The multi-tag function automatically detects peaks and displays a list of frequencies sorted by level or frequency.

The U3661 allows channels to be set for communication systems in major countries.

Most communication systems utilize the FDMA (Frequency Division Multiple Access) method. When observing signals with the U3661. each carrier band to be measured can be registered in the built-in table as a user channel. This makes it possible to call the center frequency by the channel number, thus improving efficiency.

Channel numbers from 1 to 99 can be registered, and two tables are provided. For TV broadcast waves, frequencies can be preset according to the VHF, UHF, CATV BS and CS band names of major countries.

If the CMDA option (OPT 60) is added to the U3661. the CDMA transmission characteristics specified in the IS-95 and J-STD-008 standards can be measured in a single operation.

Functional Features

– Automatic internal setting of CDMA parameters

– Frequency adjustment settings by channel number

– High-stability CDMA channel power measurement function

– High-sensitivity power measurement with built-in preamplifier

Measurement items

– Channel power measurement

– OBW measurement

– ACP (Spectrum Mask) Measurement

– Spurious emission (in-band) measurement

R3860A RF Component Analyzer

R3768/3770 Network Analyzers

Next-generation analyzer family – world’s fastest 5 µs/Point analyzer

Measurement frequency range from 300 kHz to 8 and 20 GHz, depending on model configuration

● World’s fastest 5 µs/point scan rate

2- to 4-port model options available

● System dynamic range of 125 dB (typical)

● Balanced measurements at 20 GHz

Communication services such as cell phones and wireless LANs have increased the use of multiple frequency bands, while at the same time terminals are becoming smaller.

These trends have led to the widespread use of RF modules that combine multiple functions.

In addition, for existing high-frequency components, the ability to perform increasingly complex measurements more efficiently is a critical goal as miniaturization and the wider use of balanced circuits become more widespread.

ADVANTEST has introduced a new generation of analyzers with the flexibility to handle all tasks requiring extremely high accuracy, high speed measurements and superior analysis capabilities.

The R3860A RF Component Analyzer is a new generation of analyzers that provides the flexibility to measure RF modules with a wide range of functions.

Its flexibility covers a wide range of uses from RF modules combining multiple functions to frequency conversion circuits and other active components.

The R3768/3770 network analyzers are high-performance, multi-port analyzers designed with an increased focus on measuring passive components.

Higher frequencies are also supported, with the R3680A*1/3768 supporting frequencies from 300 kHz to 8 GHz and the R3770 supporting frequencies from 300 kHz to 20 GHz.

All models feature software fixturing that enables real-time simulation of virtual matching circuits and normalized impedance conversion in addition to S-parameter analysis.

With the world’s fastest high-speed scanning speed of 5 µs/point, even complex analysis simulations can be completed immediately.

In addition, the multiport models enable software balance simulation and balance parameter analysis.

When used in conjunction with the flexible multi-window and multi-trace capabilities, these models also allow for instant measurement of complex analytical projects.

The large, high-visibility display is a key factor in improving analysis efficiency, as it simultaneously displays multi-port paths in addition to fixture simulation traces.

Automated operation support and external device interfaces

The analyzer provides multiple interfaces to a variety of external instruments. The front panel of the analyzer comes standard with mouse and keyboard connectors.

The rear panel has GPIB, LAN, printer ports, and VGA monitor output connectors.

In addition, the analyzer’s built-in parallel port allows control of automated equipment without the need for an external controller, providing two channels of 8-bit outputs and two channels of 4-bit inputs and outputs.

High-speed, high-precision high-frequency measurements

The R3860A RF component analyzer and the R3768/3770 network analyzers use our original analog technology and high-speed operating algorithms to achieve a system dynamic range of 125 dB (typical).

The measurement performance of these analyzers easily reaches the level of measurements required for filters designed for cell phone base stations, enabling high dynamic range measurements to be performed at high speed.

In addition, the R3860A and R3768/3770 set a precedent for improved total throughput, since even the choice of a broadband RBW filter ensures a wide dynamic range for high-speed measurements.

Trace noise is also reduced to half that of previous ADVANTEST products.

In addition, other features of the ADVANTEST analyzer have been enhanced for high-speed, stable measurements.

Outstanding measurement performance

With a system dynamic range of up to 125 dB (typical), a greater range of RF components and modules can be measured.

With the world’s fastest measurement speed of 5 µs/point and 16 measurement channels, the analyzer can be used for a wide range of applications, such as design, evaluation, and front-end checkout of integrated multi-function modules.

Models with an upper operating frequency limit of 20 GHz

Despite the higher frequency of WLAN communications in the 5 GHz band and the high standards of harmonics measurement in cellular phones, there is a need for a larger measurement range to measure wider frequency bands.

The R3860A provides an application software package with an extended upper frequency limit of 20 GHz, suitable for measuring devices that have reached demanding standards in recent years.

(The R3770 also operates from 300 kHz to 20 GHz).

●High-speed, high-precision measurement LD

●High-speed measurement option: 0.5 s

●Narrow coherence measurement resolution: 0.001 mm

●Ten times higher wavelength accuracy: ±0.01 nm (option)

●High wavelength resolution option: 0.01 nm at 650 nm

Wide range of measurement wavelengths: 350 nm to 1000 nm

●Compact and lightweight platform

High throughput capability

The Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm.

The Q8341 utilizes a Fourier spectroscopy system with a Michelson interferometer so that coherence can be measured.

With a narrow wavelength resolution of 0.01 nm, the Q8341 is very effective in evaluating not only CD/DVD laser diodes, but also blue-violet laser diodes.

In addition, the built-in He-Ne laser serves as a wavelength reference, ensuring high wavelength measurement accuracy of ±0.01 nm.

Finally, the Q8341’s fast measurement speed of 0.5 seconds* makes it ideal for evaluating the temperature characteristics of system components.

Coherent measurement resolution: 0.001 mm

● Wavelength resolution (650 nm):

0.05 nm (standard), 0.01 nm (option)

Peak wavelength measurement resolution of 0.001 nm

● Wavelength measurement accuracy:

±0.05 nm (standard), ±0.01 nm (option)

●Maximum input level: ±10 dBm

●Maximum coherence measurement length:

Approx. 10 mm (standard), Approx. 40 mm (option)

●Wavelength measurement range 350 to 1000 nm

●Small size and light weight

Measurement Principle

The Q8341 utilizes a Michelson interferometer. In this arrangement, light from the device under test is split into two paths (interference is generated between the two paths).

This produces an interferogram. The horizontal axis represents the difference in length (i.e., time or phase) of the two optical paths. And the vertical axis represents the intensity of the interfering light.

This is the autocorrelation of the device under test. FFT processing of this function yields the power spectrum. For this purpose, a He-Ne laser is used as a wavelength reference source.

Features

High-speed measurement option: 0.5 s.

Ideal for manufacturing/production environments The Q8341 can measure an entire span in approximately 0.5 seconds. This feature makes the Q8341 ideal for laser and LED production lines.

In addition, this fast measurement speed is ideal for high capacity environments.

Outstanding coherent analysis length

Analysis length Approx. 40 mm maximum (option)

Approx. 10 mm maximum (standard)

Maximum length resolution 0.001 mm

The Q8341 also evaluates the coherence of optical disk laser diodes. with an analysis length of up to 40 mm and a resolution as narrow as 0.001 mm, the Q8341 is ideally suited for evaluating blue-violet laser diodes and other compact optical components.

High wavelength accuracy

Wavelength accuracy: ±0.01 nm (optional), ±0.05 nm (standard)

The Q8341’s built-in Ne-He laser reference light source enables spectral measurements with high wavelength accuracy.

Narrow-resolution measurement of the oscillation mode of a blue-violet laser diode

Wavelength resolution (at 650 nm):

0.01 nm (optional)

0.05 nm (standard)

The Q8341 has a narrow resolution that separates the oscillation modes of blue-violet laser diodes. In addition, the peak wavelength is measured with a resolution of 0.001 nm, making it ideal for monitoring measurement results affected by the DUT environment.

For high-throughput measurements

The Q8341 utilizes a large-capacity memory and a high-performance calculation unit to quickly store data. The calculation unit then performs calculations on this data to display the specified wavelength and span.

For example, if the Q8341 is to analyze spectra in two wavelength ranges (650 nm ±50 nm and 780 nm ±50 nm), it can perform spectral analysis of two different LDs by simply changing its display range.

All of this can be accomplished without reconfiguring the system. As a result, the Q8341 reduces the indexing time for mass production system use.

Optical Measuring Instruments and Optical Device Test Systems

Optical Spectrum Analyzer for Coherent Measurements

■Coherence measurement

■High-speed measurements at 1.5 sec/scan

Wide wavelength range from 0.35 micron to 1.75 micron

■Wavelength measurement accuracy of 0.1 nm

The Q8344A is an optical spectrum analyzer with a wide wavelength range from 0.35 to 1.75 µm.

By using a Fourier spectroscopy system with a Michelson interferometer, it is possible to analyze coherence that cannot be obtained with a dispersive spectroscopy system using a monochromator.

It demonstrates the ability to evaluate laser diodes for optical and video disks.

The Optical Measurement Instruments and www.abb-drive.com Optical Devices Test System has a built-in He-Ne laser used as a reference wavelength with a wavelength accuracy of ± 0.1 nm (1.3 µm), which ensures long-term measurement stability even without wavelength calibration.

With a maximum wavelength resolution of 0.05 nm (0.85 µm), the Q8344A is suitable for measuring laser diodes with narrow mode intervals.

Measurement speeds of about 1.5 seconds (0.4 to 1.05 µm and 0.8 to 1.75 µm) are independent of the analysis span, so it can be used as a system component.

With its versatile display, analysis, and processing capabilities, the Q8344A can be used for a variety of component characterization applications, from light-emitting components such as laser diodes and LEDs to optical components such as optical fibers and filters.

Coherent Measurements

Since the Q8344A uses a Michelson interferometer, it can be used for coherence measurements. This feature makes it easy to evaluate the performance of noise suppression caused by the return light of laser diodes in video disks.

An analysis range of approximately ±10 mm enables measurement of the coherence length of SLDs (Super Light Emitting Diodes) used in fiber optic gyros.

High-speed measurement at 1.5 sec/scan

Ideal for production applications

The Q8344A utilizes a Fourier spectroscopy system so that measurements can be completed in less than 1.5 seconds, regardless of the measurement span and sensitivity (provided that the starting wavelength is 0.4 µm or longer and that the measurement does not cover both short and long wavelengths).

The analyzer is therefore suitable for measuring laser diodes and light emitting diodes on production lines. In addition, it can be used to evaluate the transmission and loss characteristics of optical fibers and filters.

When used as a system component, the analyzer can be triggered, measured, and output data in just 1.5 seconds, dramatically increasing system throughput.

Wavelength measurement accuracy of ± 0.1 nm

Measurements are accurate to ± 0.1 nm (1.3 µm) using the built-in He-Ne laser as a reference light source.

As a result, accurate wavelength measurements can be made without wavelength calibration.

Maximum wavelength range of 0.05 nm

The Q8344A has a maximum resolution of 0.05 nm at short wavelengths (0.85 µm), making it possible to measure CD and visible laser diodes in fully resolved oscillation mode, one by one.

Large-diameter fiber input (option)

An optional 200 µm large aperture input is available. This option is required when analyzing devices with wavelengths larger than the standard fiber aperture (GI 50 µm).

For laser diode analysis, the standard 50 µm size is recommended, while for LED analysis, this optional size is recommended.

The Q8384 Optical Spectrum Analyzer measures and evaluates ultra-high-speed optical DWDM transmission systems and optical components with high wavelength resolution and high accuracy.

The new high-end optical spectrum analyzer utilizes a new four-pass monochromator system to provide high wavelength resolution and wide dynamic range.

● 10 pm resolution bandwidth

● 20 pm wavelength accuracy (using Opt.)

● Wide dynamic range: 50 dB (±0.1 nm), 60 dB (±0.2 nm)

● Optical frequency display

● Accurate NF measurement of EDFAs

● Handles power levels up to +23 dBm (200 mW)

● Rich WDM analysis functions

● Provides limit line function for pass/fail analysis

In DWDM optical communications, accurate wavelength measurements of light sources are required. Evaluating these specifications requires optical spectrum analyzers with higher resolution bandwidth and wavelength accuracy.

To meet these stringent requirements, the Q8384 has the world’s highest wavelength resolution of 10 pm* and wavelength accuracy of 20 pm.

It also achieves 20 pm wavelength accuracy in the 1550 nm band. This high performance enables the Q8384 to accurately measure the oscillating wavelength characteristics of laser diodes.

DWDM optical communication systems also include wavelength division multiplexing channels.

DWDM optical communication systems also contain WDM channels spaced close to 50 GHz (0.4 nm).

In this environment, an optical spectrum analyzer with excellent dynamic range is required to separate the optical signal and measure the noise figure (NF) of the optical amplifier.

With a dynamic range of 50 dB at 0.1 nm and 60 dB at 0.2 nm, the Q8384 fully meets these requirements.

The instrument is equipped with an automatic optical amplifier NF measurement and calculation function, allowing the user to perform the measurement in a simple manner.

The Q8384 can be optionally equipped with a built-in reference wavelength light source and an EE-LED (Edge Light Emitting Diode).

When calibrated with this reference light source, the instrument ensures wavelength accuracy of 20 pm in the 1550 nm band.

Utilizing the EE-LED’s broadband light source, the Q8384 allows the user to easily measure and evaluate the transmission and loss characteristics of narrowband filters.

Superior Fundamental Performance

10 pm High Wavelength Resolution The Q8384 achieves a wavelength resolution bandwidth of up to 10 pm by using a newly developed monochromator system.

This makes it possible to measure and evaluate the sidebands of 10 Gbps intensity-modulated optical signals, a task previously impossible with conventional spectrum analyzers.

20 pm high wavelength accuracy

Calibrated with the built-in calibration light source (option 25), the Q8384 achieves wavelength measurement accuracy of ±20 pm in the C-band wavelength range from 1530 to 1570 nm.

The Q8384 achieves wavelength measurement accuracy of ±20 pm in the C-band wavelength range of 1530 to 1570 nm and ±40 pm in the L-band wavelength range of 1570 to 1610 nm.

It enables accurate characterization of laser diodes and filters used in DWDM transmission systems.

The Q8384 can also accurately measure the wavelength spacing of WDM signals because of its ±10 pm wavelength linearity over the 1530 to 1570 nm wavelength range.

50 dB (±0.1 nm)/60 dB (±0.2 nm) Wide Dynamic Range

In DWDM systems, signals need to be WDMed at intervals of 50 GHz (0.4 nm) or less.

Separating and measuring these closely spaced signals requires an optical spectrum analyzer with excellent dynamic range.

The Q8384’s dynamic range of 60 dB or more at 0.2 nm makes it ideal for this task.

With a dynamic range of 50 dB or more at 0.1 nm, the instrument can support future DWDM systems with closer signal spacing.

+23 dBm (200 mW) high-power direct input The Q8384 can directly measure high-power signals from fiber amplifiers or pump laser diodes without attenuation.

Extensive Analysis Functions

Sweep Function

The Q8384 displays the optical frequency on the horizontal axis; this is ideal for measuring the grid frequencies of standardized wavelengths specified by the ITU-T (International Telecommunication Union Telecommunication Standardization Sector).

Measuring the noise figure of a fiber-optic amplifier The Q8384 improves the noise figure of a fiber-optic amplifier by enhancing the dynamic range, polarization correlation, level accuracy, linearity, and accuracy of wavelength resolution settings.

As well as applying curve fitting and other features, the Q8384 realizes high-precision noise figure measurements at the touch of a button.

Since the Q8384 can accurately determine the ASE signal level of DWDM signals that are multiplexed at 10-minute intervals.

Since the Q8384 can accurately determine the ASE signal level of DWDM signals multiplexed at intervals of 50 GHz (0.4 nm) or narrower, it not only performs accurate noise figure measurements, but it can also accurately measure the noise figure of DWDM signals multiplexed at intervals of 10 minutes.

It not only performs accurate noise figure measurements, but also displays multiple lists of measurement results at the same time.

WDM Analysis Functions

The Q8384 can display up to 256 wavelength peaks and power levels of WDM signals.

It displays the deviation of the wavelength and power level from the ITU-T channel spacing or reference signal as well as the absolute value.

Alternate Scanning Function

The Q8384 can display two sets of measurements under different setup conditions in two windows. These windows are always rewritable using the Q8384’s alternate scan feature.

With this feature, users can make detailed measurements of signals in a specific wavelength band while monitoring the entire wavelength region of the WDM system.

D3286 Pulse Pattern Generator/Bit Error Detector

150 Mbps to 12.5 Gbps BER Performance Test System for SDH/SONET

D3286 Error Detector

SDH/SONET frame synchronization for system evaluation

Region-specific error detection for SDH frame and ATM cell measurements

Burst data measurement for loopback testing

Auto-search function to adjust the most suitable timing and voltages

Data and clock monitoring outputs

FD drive for storing measurement results and setup data

Graphical user interface (GUI) environment for an easy-to-understand operating environment

Ultra-high-speed digital telecommunication networks are being built to accommodate the transmission of high-capacity information in the multimedia era of the future.

To evaluate and analyze O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems

Evaluating and analyzing O/E and E/O modules and ultra-high-speed logic devices for multiplexers and repeaters in telecommunication systems requires the use of high-speed, high-quality signal sources.

The D3186 Pulse Pattern Generator/D3286 Error Detector provides excellent performance!

The D3186 Pulse Pattern Generator/D3286 Error Detector delivers excellent signals with high speed, high quality, and a variety of error-detection features over the 150 Mbps to 12.5 Gbps operating frequency range.

In addition, the D3186/D3286. with its 8 M-bit mass memory and ADVANTEST’s unique frame pattern generation capability, is the next generation of BER test systems.

The D3186/D3286 is a new generation of BER performance test systems compatible with STM-1 (155.52 M bps) to STM-64 (9.95 Gbps) in SDH/SONET.

Generates SDH/SONET Frame Patterns Close to Actual Data

For evaluating optical transport equipment, E/O and O/E modules

Frame-level testing is required for O/OE and E/O testing of SDH/SONET systems.

The D3186 Pulse Pattern Generator, in addition to having a large WORD memory of 8 M bits in length, provides a frame-level test in the STM frame header section.

The D3186 Pulse Pattern Generator, in addition to having a large 8 M-bit WORD memory, provides the optional functions of inserting a WORD pattern into the header portion of the STM frame and inserting an arbitrary PRBS into the payload portion, thus realizing a test pattern that is very close to the actual data.

Of course, the D3286 error detector can measure errors in the header and payload sections separately.

In addition, the D3286 has a frame synchronization function and a specific area error measurement function, which can effectively support the location of the cause of the error.